Author:Jean-Luc Danger

Publications
Detecting Faults in Inner-Product Masking Scheme - IPM-FD: IPM with Fault Detection Wei Cheng, Claude Carlet, Kouassi Goli, Jean-Luc Danger and Sylvain Guilley In:Proceedings of 8th International Workshop on Security Proofs for Embedded Systems
PROOFS 2017. 6th International Workshop on Security Proofs for Embedded Systems Ulrich Kühne, Jean-Luc Danger and Sylvain Guilley (editors) EPiC Series in Computing, volume 49