Hybrid De-Embedding for 116Gbps Test Channels

EasyChair Preprint 9006

Abstract

This paper presents de-embedding method to remove test fixture impact at 116Gbps to predict the performance at BGA balls. It describes a technique to improve the probe contact discontinuity caused by measurement probe contacts. Investigation and analysis show reduction on reflection compared to the normative way. Proof of concept is discussed, and the results are interpreted in Time Domain reflectometry (TDR). This method is useful to audience who face the de-embedding issue to obtain the actual system performance at 116Gbps.

Keyphrases: SerDes, de-embedding, high-speed measurement, reflections

@booklet{EasyChair:9006,
  author    = {Zahrein Bin Yaacob and Chooi Yee Kong},
  title     = {Hybrid De-Embedding for 116Gbps Test Channels},
  howpublished = {EasyChair Preprint 9006},
  year      = {EasyChair, 2022}}