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Invited Paper: Opportunities of Chip Power Integrity and Performance Improvement Through Wafer Backside (BS) Connection
Rongmei Chen
,
Giuliano Sisto
,
Odysseas Zografos
,
Dragomir Milojevic
,
Pieter Weckx
,
Geert Van der Plas
and
Eric Beyne
EasyChair Preprint 9239
Switch-Mode based Interposer developed to self-test an MCM without Known Good Dice
Peter Wang
EasyChair Preprint 3572
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