Download PDFOpen PDF in browserSwitch-Mode based Interposer developed to self-test an MCM without Known Good DiceEasyChair Preprint 35729 pages•Date: June 7, 2020AbstractTo test an unknown die at its logic address in lieu of BSDL specified ID code, this advanced iJTAG Technology using switch-mode based interposer to self-test a MCM without Known-Good-Dice (KGD). Keyphrases: BEOL, Boundary Scan, DDR, Interposer, Known-Good-Die, MCM, chiplet, self-test, substrate
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